inovel - innovative elektronik

2007

in November 2007 - 1st inovel technology day

On 30.11.2007, inovel invited guests to Friedrichshafen to attend the 1st technology day. The new test strategy was presented, involving elements of the function test integrated into a flying probe tester from Takaya.

Furthermore, Dr. Ing. Thomas Ahrens of the Fraunhofer ISIT provided information about possibilities for influencing the reliability of subassemblies right from the design phase.

 

With 70 guests, the event was fully booked and proved very popular.

in May 2007 - We're on show

We present out latest products in Hall 10 Stand 15 at the Intertech in Dornbirn from 03.05.2007 to 05.05.2007.

in February 2007 - Flying probe incircuit tester from Takaya

The latest generation of testers in the 9411 series from Takaya offers the following convincing advantages:

 

  • Testing without adapter, therefore low initialisation costs and a high test coverage
  • Test possible with the smallest structures without "design for testability"
  • Automatic program creation from the CAD data
  • Optical tests possible because of the integrated camera system
  • Incircuit programming during the test procedure
  • Can be combined with a function test
  • Can be combined with a boundary scan
inovel - innovative elektronik